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Charged pion form factor between Q2=0.60 and 2.45 GeV2. II. Determination of, and results for, the pion form factor

机译:Q2 = 0.60至2.45 GeV2之间的带电介子形状因数。二。介子形状因数的确定和结果

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摘要

The charged pion form factor, Fπ(Q2), is an important quantity that can be used to advance our knowledge of hadronic structure. However, the extraction of Fπ from data requires a model of the 1H(e,e'π+)n reaction and thus is inherently model dependent. Therefore, a detailed description of the extraction of the charged pion form factor from electroproduction data obtained recently at Jefferson Lab is presented, with particular focus given to the dominant uncertainties in this procedure. Results for Fπ are presented for Q2=0.60-2.45 GeV2. Above Q2=1.5 GeV2, the Fπ values are systematically below the monopole parametrization that describes the low Q2 data used to determine the pion charge radius. The pion form factor can be calculated in a wide variety of theoretical approaches, and the experimental results are compared to a number of calculations. This comparison is helpful in understanding the role of soft versus hard contributions to hadronic structure in the intermediate Q2 regime.
机译:带电的离子形式因子Fπ(Q2)是一个重要量,可用于增进我们对强子结构的认识。但是,从数据中提取Fπ需要1H(e,e'π+)n反应的模型,因此固有地与模型有关。因此,本文详细介绍了从最近在杰斐逊实验室获得的电生产数据中提取带电离子形式因子的过程,并特别关注此过程中的主要不确定性。给出了Q2 = 0.60-2.45 GeV2的Fπ结果。高于Q2 = 1.5 GeV2时,Fπ值系统地低于单极子参数化,该参数描述了用于确定介子电荷半径的低Q2数据。介子形状因数可以通过多种理论方法进行计算,并将实验结果与大量计算结果进行比较。这种比较有助于理解在中层Q2方案中强硬结构对软硬作用的作用。

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